WebCPC CPC COOPERATIVE PATENT CLASSIFICATION

G11C　STATIC STORES (information storage based on relative movement between record carrier and transducer G11B; semiconductor devices for storage H01L, e.g. H01L 27/108 to H01L 27/115; pulse technique in general H03K, e.g. electronic switches H03K 17/00; {using a static store as a picture recording medium H04N 5/907})

G11C 5/00 Details of stores covered by G11C 11/00

G11C 5/005 ・{Circuit means for protection against loss of information of semiconductor storage devices (manufacturing semi-conductor by using bombardement with radiation H01L 21/26; error detection, monitoring G06F 11/00)}

G11C 5/02 ・Disposition of storage elements, e.g. in the form of a matrix array

G11C 5/025 ・・{Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device (geometrical lay-out of the components in integrated circuits, H01L 27/0207)}

G11C 5/04 ・・Supports for storage elements, Supports for storage elements, {e.g. memory modules}; Mounting or fixing of storage elements on such supports

G11C 5/05 ・・・Supporting of cores in matrix

G11C 5/06 ・Arrangements for interconnecting storage elements electrically, e.g. by wiring

G11C 5/063 ・・{Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay}

G11C 5/066 ・・{Means for reducing external access-lines for a semiconductor memory clip e.g. by multiplexing at least address and data signals}

G11C 5/08 ・・for interconnecting magnetic elements, e.g. toroidal cores

G11C 5/10 ・・for interconnecting capacitors

G11C 5/12 ・Apparatus or processes for interconnecting storage elements, e.g. for threading magnetic cores

G11C 5/14 ・Power supply arrangements (in general G05F, H02J, H02M), {e.g. Power down/chip (de)selection, layout of wiring/power grids, multiple supply levels}

G11C 5/141 ・・{Battery and back-up supplies (back-up supplies per se H02J 9/061)}

G11C 5/142 ・・{Contactless power supplies, e.g. RF, induction, IR (in general H02J 5/00)}

G11C 5/143 ・・{Detection of memory cassette insertion/removal; Continuity checks of supply and ground lines (in general G01R 31/02); Detection of supply variations/interruptions/levels (G11C 5/148 takes precedence); Switching between alternative supplies (back-up supplies per se H02J 9/061), (G11C 5/141 takes precedence)}

G11C 5/144 ・・・{Detection of predetermined disconnection or reduction of power supply, e.g. power down or power standby}

G11C 5/145 ・・{Applications of charge pumps (charge pumps per se H02M 3/07); Boosted voltage circuits (for logic circuits or inverting circuits H03K 19/00); Clamp circuits therefor (G11C 5/141 takes precedence)}

G11C 5/146 ・・・{Substrate bias generators (G11C 5/141 takes precedence; in general G05F 3/205)}

G11C 5/147 ・・{Voltage reference generators, voltage and current regulators (in general G05F 3/24); Internally lowered supply level (in general G05F 1/462); Compensation for voltage drops (G11C 5/141 takes precedence)}

G11C 5/148 ・・{Details of power up or power down circuits, standby circuits or recovery circuits}

G11C 7/00 Arrangements for writing information into, or reading information out from, a digital store (G11C 5/00 takes precedence; auxiliary circuits for stores using semiconductor devices G11C 11/4063, G11C 11/413, G11C 11/4193)

G11C 7/005 ・{with combined beam-and individual cell access}

G11C 7/02 ・with means for avoiding parasitic signals

G11C 7/04 ・with means for avoiding disturbances due to temperature effects

G11C 7/06 ・Sense amplifiers; Associated circuits, {e.g. timing or triggering circuits}(amplifiers per se H03F, H03K)

G11C 7/062 ・・{Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs}

G11C 7/065 ・・{Differential amplifiers of latching type}

G11C 7/067 ・・{Single-ended amplifiers}

G11C 7/08 ・・Control thereof

G11C 7/10 ・Input/output (I/0) data interface arrangements, e.g. I/0 data control circuits, I/O data buffers (level conversion circuits in general H03K 19/0175)

G11C 7/1003 ・・{Interface circuits for daisy chain or ring bus memory arrangements}

G11C 7/1006 ・・{Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor}

G11C 7/1009 ・・・{Data masking during input/output}

G11C 7/1012 ・・・{Data reordering during input/output, e.g. crossbars, layers of multiplexers, shifting or rotating }

G11C 7/1015 ・・{Read-write modes for single port memories, i.e. having either a random port or a serial port}

G11C 7/1018 ・・・{Serial bit line access mode, e.g. using bit line address shift registers, bit line address counters, bit line burst counters}

G11C 7/1021 ・・・・{Page serial bit line access mode, i.e. using an enabled row address stroke pulse with its associated word line address and a sequence of enabled column address stroke pulses each with its associated bit line address}

G11C 7/1024 ・・・・・{Extended data output (EDO) mode, i.e. keeping output buffer enabled during an extended period of time}

G11C 7/1027 ・・・・{Static column decode serial bit line access mode, i.e. using an enabled row address stroke pulse with its associated word line address and a sequence of enabled bit line addresses}

G11C 7/103 ・・・{using serially addressed read-write data registers (G11C 7/1036 takes precedence)}

G11C 7/1033 ・・・・{using data registers of which only one stage is addressed for sequentially outputting data from a predetermined number of stages, e.g. nibble read-write mode}

G11C 7/1036 ・・・{using data shift registers}

G11C 7/1039 ・・・{using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers}

G11C 7/1042 ・・・{using interleaving techniques, i.e. read-write of one part of the memory while preparing another part}

G11C 7/1045 ・・・{Read-write mode select circuits}

G11C 7/1048 ・・{Data bus control circuits, e.g. precharging, presetting, equalising}

G11C 7/1051 ・・{Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits}

G11C 7/1054 ・・・{Optical output buffers}

G11C 7/1057 ・・・{Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load }

G11C 7/106 ・・・{Data output latches }

G11C 7/1063 ・・・{Control signal output circuits, e.g. status or busy flags, feedback command signals}

G11C 7/1066 ・・・{Output synchronization }

G11C 7/1069 ・・・{I/O lines read out arrangements (global or local sense amplifiers for bit lines G11C 7/06)}

G11C 7/1072 ・・{for memories with random access ports synchronised on clock signal pulse trains, e.g. synchronous memories, self timed memories}

G11C 7/1075 ・・{for multiport memories each having random access ports and serial ports, e.g. video RAM}

G11C 7/1078 ・・{Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits}

G11C 7/1081 ・・・{Optical input buffers }

G11C 7/1084 ・・・{Data input buffers, e.g. comprising level conversion circuits, circuits for adapting load}

G11C 7/1087 ・・・{Data input latches}

G11C 7/109 ・・・{Control signal input circuits}

G11C 7/1093 ・・・{Input synchronization}

G11C 7/1096 ・・・{Write circuits, e.g. I/O line write drivers}

G11C 7/12 ・Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines

G11C 7/14 ・Dummy cell management; Sense reference voltage generators

G11C 7/16 ・Storage of analogue signals in digital stores using an arrangement comprising analogue/digital (A/D) converters, digital memories and digital/analogue (D/A) converters

G11C 7/18 ・Bit line organisation; Bit line lay-out

G11C 7/20 ・Memory initialisation circuits, e.g. when powering up or down, memory clear, latent image memory

G11C 7/22 ・Read-write (R-W) timing or clocking circuits; Read-write (R-W) control signal generators or management

G11C 7/222 ・・{Clock generating, synchronizing or distributing circuits within memory device}

G11C 7/225 ・・{Clock input buffers}

G11C 7/227 ・・{Timing of memory operations based on dummy memory elements or replica circuits}

G11C 7/24 ・Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells

G11C 8/00 Arrangements for selecting an address in a digital store (for stores using transistors G11C 11/407, G11C 11/413; {switching or gating circuits for general use H03K 17/00})

G11C 8/005 ・{with travelling wave access}

G11C 8/04 ・using a sequential addressing device, e.g. shift register, counter {(FIFO G06F 5/06; LIFO G06F 7/78; multidimensional memory addressing G06F 12/0207)}

G11C 8/06 ・Address interface arrangements, e.g. address buffers (level conversion circuits in general H03K 19/0175)

G11C 8/08 ・Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines

G11C 8/10 ・Decoders

G11C 8/12 ・Group selection circuits, e.g. for memory block selections, chip selection, array selection

G11C 8/14 ・Word line organisation; Word line lay-out

G11C 8/16 ・Multiple access memory array, e.g. addressing one storage element via at least independent addressing line groups {(multiport memories in general G11C 7/1075)}

G11C 8/18 ・Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe (RAS) or column address strobe (CAS) signals

G11C 8/20 ・Address safety or protection circuits, i.e. arrangements for preventing unauthorised or accidental access

G11C 11/00 Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor (G11C 14/00 to G11C 21/00 take precedence)

G11C 11/005 ・{comprising combined but independently operative RAM-ROM, RAM-PROM, RAM-EPROM cells}

G11C 11/02 ・using magnetic elements {(using multibit magnetic storage elements G11C 11/5607; counters with magnetic elements H03K 23/76; pulse generators, static switches, logic circuits with such elements H03K 3/45, H03K 17/80, H03K 19/16; measurement of magnetic variables G01R 33/00)}

G11C 11/04 ・・using rod-type storage elements {contains no documents; see G11C 11/06085, G11C 11/14, G11C 11/155}

G11C 11/06 ・・using single-aperture storage elements, e.g. ring core; using multi-aperture plates in which each individual aperture forms a storage element

G11C 11/06007 ・・・{using a single aperture or single magnetic closed circuit}

G11C 11/06014 ・・・・{using one such element pro bit}

G11C 11/06021 ・・・・・{with destructive read-out}

G11C 11/06028 ・・・・・・{Matrixes}

G11C 11/06035 ・・・・・・・{"bit"- organised, e.g. 2 1/2D, 3D or a similar organisation, i.e. bit core selection for writing or reading, by at least two coincident partial currents}

G11C 11/06042 ・・・・・・・{"word"-organised, e.g. 2D organisation or linear selection, i.e. full current selection through all the bit-cores of a word during reading}

G11C 11/0605 ・・・・・{with non-destructive read-out}

G11C 11/06057 ・・・・・・{Matrixes}

G11C 11/06064 ・・・・・・・{"bit"-organised (2 1/2D, 3D or similar organisation)}

G11C 11/06071 ・・・・・・・{"word"-organised (2D organisation or linear selection)}

G11C 11/06078 ・・・・{using two or more such elements pro bit}

G11C 11/06085 ・・・{Multi-aperture structures or multi-magnetic closed circuits, each aperture storing a "bit", realised by rods, plates, grids, waffle-irons, (i.e. grooved plates) or similar devices}

G11C 11/06092 ・・・{Multi-aperture structures or multi-magnetic closed circuits using two or more apertures per bit}

G11C 11/061 ・・・using element with single aperture or magnetic loop for storage, one element per bit, and for destructive read-out {contains no documents, see G11C 11/06007, G11C 11/06014, G11C 11/06021, G11C 11/06028}

G11C 11/063 ・・・・bit organised, such as 2 1/2D, 3D organisation, i.e. for selection of an element by means of at least two coincident parital currents both for reading and for writing {contains no documents; see G11C 11/06035}

G11C 11/065 ・・・・word organised, such as 2D organisation, or linear selection, i.e. for selection of all the elements of a word by means of a single full current for reading {contains no documents; see G11C 11/06042}

G11C 11/067 ・・・using elements with single aperture or magnetic loop for storage, one element per bit, and for non-destructive read-out {contains no documents, see G11C 11/0605 to G11C 11/06071}

G11C 11/08 ・・using multi-aperture storage elements, e.g. using transfluxors; using plates incorporating several individual multi-aperture storage elements (G11C 11/10 takes precedence; using multi-aperture plates in which each individual aperture forms a storage element G11C 11/06)

G11C 11/10 ・・using multi-axial storage elements

G11C 11/12 ・・using tensors; using twistors, i.e. elements in which one axis of magnetisation is twisted

G11C 11/14 ・・using thin-film elements

G11C 11/15 ・・・using multiple magnetic layers (G11C 11/155 takes precedence)

G11C 11/155 ・・・with cylindrical configuration

G11C 11/16 ・・using elements in which the storage effect is based on magnetic spin effect {(sensors using magnetoresistive multilayer structures G01R 33/093; thin layer magnetic read heads for magnetic discs G11B 5/31; non-reciprocal magnetic elements in waveguides H01P; composition of ferromagnetic material H01F 1/00; gyrators H03H 7/002)}

G11C 11/161 ・・・{details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell}

G11C 11/165 ・・・{Auxiliary circuits}

G11C 11/1653 ・・・・{Address circuits or decoders}

G11C 11/1655 ・・・・・{Bit-line or column circuits}

G11C 11/1657 ・・・・・{Word-line or row circuits}

G11C 11/1659 ・・・・{Cell access}

G11C 11/1673 ・・・・{Reading or sensing circuits or methods}

G11C 11/1675 ・・・・{Writing or programming circuits or methods}

G11C 11/1677 ・・・・{Verifying circuits or methods}

G11C 11/1693 ・・・・{Timing circuits or methods}

G11C 11/1695 ・・・・{Protection circuits or methods}

G11C 11/1697 ・・・・{Power supply circuits}

G11C 11/18 ・using Hall-effect devices

G11C 11/19 ・using non-linear reactive devices in resonant circuits {contains no documents, see G11C 11/20}

G11C 11/20 ・・using parametrons, {i.e. ferroresonant triggers; with overcritica feedback magnetic amplifiers or similar (pulse generators using parametrons and ferroresonant devices H03K 19/162, H03K 19/164; counters using such elements H03K 23/001)}

G11C 11/21 ・using electric elements

G11C 11/22 ・・using ferroelectric elements {(using multibit ferroelectric storage elements G11C 11/5657; pulse generators using ferroelectric elements H03K 3/45; counters using such elements H03K 23/76)}

G11C 11/221 ・・・{using ferroelectric capacitors}

G11C 11/223 ・・・{using MOS with ferroelectric gate insulating film}

G11C 11/225 ・・・{Auxiliary circuits}

G11C 11/2253 ・・・・{Address circuits or decoders}

G11C 11/2255 ・・・・・{Bit-line or column circuits}

G11C 11/2257 ・・・・・{Word-line or row circuits}

G11C 11/2259 ・・・・{Cell access}

G11C 11/2273 ・・・・{Reading or sensing circuits or methods}

G11C 11/2275 ・・・・{Writing or programming circuits or methods}

G11C 11/2277 ・・・・{Verifying circuits or methods}

G11C 11/2293 ・・・・{Timing circuits or methods}

G11C 11/2295 ・・・・{Protection circuits or methods}

G11C 11/2297 ・・・・{Power supply circuits}

G11C 11/23 ・・using electrostatic storage on a common layer, e.g. Forrester-Haef tubes, {William tubes}(G11C 11/22 takes precedence; {construction of Williams tubes H01J 31/00})

G11C 11/24 ・・using capacitors (G11C 11/22 takes precedence; using a combination of semiconductor devices and capacitors G11C 11/34, e.g. G11C 11/40)

G11C 11/26 ・・using discharge tubes {(counters using such elements H03K 25/00)}

G11C 11/265 ・・・{counting tubes, e.g. decatrons, trochotrons (counters using such elements H03K 29/00)}

G11C 11/28 ・・・using gas-filled tubes {counting tubes G11C 11/265; pulse generators, electronic switches, logic circuits using such elements H03K 3/37, H03K 17/52, H03K 19/04}

G11C 11/30 ・・・using vacuum tubes {counting tubes G11C 11/265; pulse generators, electronic switches, logic circuits using such elements H03K 3/37, H03K 17/52, H03K 19/04}

G11C 11/34 ・・using semiconductor devices {(processes or apparatus for the manufacture or treatment of semiconductor or solid state devices H01L 21/00; integrated circuit devices H01L 27/00; generating electric pulses, e.g. bistable devices using semiconductor devices H03K 3/00)}

G11C 11/35 ・・・with charge storage in a depletion layer, e.g. charged coupled devices {(in shift registers G11C 19/282)}

G11C 11/36 ・・・using diodes, e.g. as threshold elements, {i.e. diodes assuming a stable

G11C 11/38 ・・・・using tunnel diodes

G11C 11/39 ・・・using thyristors {or the avalanche or negative resistance type, e.g. PNPN, SCR, SCS, UJT}

G11C 11/40 ・・・using transistors

G11C 11/401 ・・・・forming cells needing refreshing or charge regeneration, {i.e. dynamic cells}

G11C 11/402 ・・・・・with charge regeneration individual to each memory cell, i.e. internal refresh

G11C 11/4023 ・・・・・・{using field effect transistors}

G11C 11/4026 ・・・・・・{using bipolar transistors}

G11C 11/403 ・・・・・with charge regeneration common to a multiplicity of memory cells, i.e. external refresh

G11C 11/404 ・・・・・・with one charge-transfer gate, e.g. MOS transistor, per cell

G11C 11/4045 ・・・・・・・{using a plurality of serially connected access transistors, each having a storage capacitor}

G11C 11/405 ・・・・・・with three charge-transfer gates, e.g. MOS transistors, per cell

G11C 11/406 ・・・・・Management or control of the refreshing or charge-regeneration cycles

G11C 11/40603 ・・・・・・{Arbitration, priority and concurrent access to memory cells for read/write or refresh operations}

G11C 11/40607 ・・・・・・{Refresh operations in memory devices with an internal cache or data buffer}

G11C 11/40611 ・・・・・・{External triggering or timing of internal or partially internal refresh operations, e.g. auto-refresh or CAS-before-RAS triggered refresh}

G11C 11/40615 ・・・・・・{Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs}

G11C 11/40618 ・・・・・・{Refresh operations over multiple banks or interleaving}

G11C 11/40622 ・・・・・・{Partial refresh of memory arrays}

G11C 11/40626 ・・・・・・{Temperature related aspects of refresh operations}

G11C 11/4063 ・・・・・Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing

G11C 11/4067 ・・・・・・for memory cells of the bipolar type

G11C 11/407 ・・・・・・for memory cells of the field-effect type

G11C 11/4072 ・・・・・・・Circuits or initialisation, powering up or down, clearing memory or presetting

G11C 11/4074 ・・・・・・・Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits

G11C 11/4076 ・・・・・・・Timing circuits (for regeneration management G11C 11/406)

G11C 11/4078 ・・・・・・・Safety or protection circuits, e.g. for preventing inadvertent or unauthorised reading or writing; Status cells; Test cells (protection of memory contents during checking or testing G11C 29/52)

G11C 11/408 ・・・・・・・Address circuits

G11C 11/4082 ・・・・・・・・{Address Buffers; level conversion circuits}

G11C 11/4085 ・・・・・・・・{Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge}

G11C 11/4087 ・・・・・・・・{Address decoders, e.g. bit - or word line decoders; Multiple line decoders}

G11C 11/409 ・・・・・・・Read-write (R-W) circuits

G11C 11/4091 ・・・・・・・・Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating

G11C 11/4093 ・・・・・・・・Input/output (I/O) data interface arrangements, e.g. data buffers (level conversion circuits in general H03K 19/0175)

G11C 11/4094 ・・・・・・・・Bit-line management or control circuits

G11C 11/4096 ・・・・・・・・Input/output (I/O) data management or control circuits, e.g. reading or writing circuits, I/O drivers, bit-line switches

G11C 11/4097 ・・・・・・・・Bit-line organisation, e.g. bit-line layout, folded bit lines

G11C 11/4099 ・・・・・・・・Dummy cell treatment; Reference voltage generators

G11C 11/41 ・・・・forming {static} cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger

G11C 11/411 ・・・・・using bipolar transistors only

G11C 11/4113 ・・・・・・{with at least one cell access to base or collector of at least one of said transistors, e.g. via access diodes, access transistors}

G11C 11/4116 ・・・・・・{with at least one cell access via separately connected emittors of said transistors or via multiple emittors, e.g. T2L, ECL}

G11C 11/412 ・・・・・using field-effect transistors only {(latent image memory G11C 7/20; multi-port cells G11C 8/160)}

G11C 11/4125 ・・・・・・{Cells incorporating circuit means for protection against loss of information (in general G11C 5/005)}

G11C 11/413 ・・・・・Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing, power reduction (in general G11C 5/00 to G11C 8/00)

G11C 11/414 ・・・・・・for memory cells of the bipolar type

G11C 11/415 ・・・・・・・Address circuits

G11C 11/416 ・・・・・・・Read-write circuits

G11C 11/417 ・・・・・・for memory cells of the field-effect type

G11C 11/418 ・・・・・・・Address circuits

G11C 11/419 ・・・・・・・Read-write circuits

G11C 11/42 ・・using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically - or optically - {feedback -} coupled

G11C 11/44 ・・using super-conductive elements, e.g. cryotron {(pulse generators using such elements H03K 3/38; counters H03K 23/001)}

G11C 11/46 ・using thermoplastic elements

G11C 11/48 ・using displaceable coupling elements, e.g. ferromagnetic cores, to produce change between different states of mutual or self-inductance {contains no documents; see subgroups G11C 17/00}

G11C 11/50 ・using actuation of electric contacts to store the information (mechanical stores G11C 23/00; switches provising a selected number of consecutive operations of the contacts by a single manual actuation of the operating part H01H 41/00)

G11C 11/52 ・・using electromagnetic relays

G11C 11/54 ・using elements simulating biological cells, e.g. neuron

G11C 11/56 ・using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency (counting arrangements comprising multi-stable elements of this type H03K 25/00, H03K 29/00)

G11C 11/5607 ・・{using magnetic storage elements}

G11C 11/5614 ・・{using conductive bridging RAM [CBRAM} or programming metallization cells [PMC]

G11C 11/5621 ・・{using charge storage in a floating gate}

G11C 11/5628 ・・・{Programming or writing circuits; Data input circuits}

G11C 11/5635 ・・・・{Erasing circuits}

G11C 11/5642 ・・・{Sensing or reading circuits; Data output circuits}

G11C 11/565 ・・{using capacitive charge storage elements}

G11C 11/5657 ・・{using ferroelectric storage elements}

G11C 11/5664 ・・{using organic memory material storage elements}

G11C 11/5671 ・・{using charge trapping in an insulator}

G11C 11/5678 ・・{using amorphous/crystalline phase transition storage elements}

G11C 11/5685 ・・{using storage elements comprising metal oxide memory material, e.g. perovskites}

G11C 11/5692 ・・{read-only digital stores using storage elements with more than two stable states}

G11C 13/00 Digital stores characterised by the use of storage elements not covered by groups G11C 11/00, G11C 23/00 to G11C 25/00

G11C 13/0002 ・{using resistance random access memory [RRAM} elements]

G11C 13/0004 ・・{comprising amorphous/crystalline phase transition cells}

G11C 13/0007 ・・{comprising metal oxide memory material, e.g. perovskites}

G11C 13/0009 ・・{RRAM elements whose operation depends upon chemical change}

G11C 13/0011 ・・・{comprising conductive bridging RAM [CBRAM} or programming metallization cells [PMCs]]

G11C 13/0014 ・・・{comprising cells based on organic memory material}

G11C 13/0016 ・・・・{comprising polymers}

G11C 13/0019 ・・・・{comprising bio-molecules}

G11C 13/0021 ・・{Auxiliary circuits}

G11C 13/0023 ・・・{Address circuits or decoders}

G11C 13/0026 ・・・・{Bit-line or column circuits}

G11C 13/0028 ・・・・{Word-line or row circuits}

G11C 13/003 ・・・{Cell access}

G11C 13/0033 ・・・{Disturbance prevention or evaluation; Refreshing of disturbed memory data}

G11C 13/0035 ・・・{Evaluating degradation, retention or wearout, e.g. by counting writing cycles}

G11C 13/0038 ・・・{Power supply circuits}

G11C 13/004 ・・・{Reading or sensing circuits or methods}

G11C 13/0059 ・・・{Security or protection circuits or methods}

G11C 13/0061 ・・・{Timing circuits or methods}

G11C 13/0064 ・・・{Verifying circuits or methods}

G11C 13/0069 ・・・{Writing or programming circuits or methods}

G11C 13/0097 ・・・{Erasing, e.g. resetting, circuits or methods}

G11C 13/02 ・using elements whose operation depends upon chemical change {(G11C 13/0009 takes precedence)}; using electrochemical charge G11C 11/00

G11C 13/025 ・・{using fullerenes, e.g. C60, or nanotubes, e.g. carbon or silicon nanotubes}

G11C 13/04 ・using optical elements {using other beam accessed elements, e.g. electron, ion beam (using electrostatic memory tubes G11C 11/23; recording of television signals H04N 5/76)}

G11C 13/041 ・・{using photochromic storage elements (G11C 13/042 takes precedence)}

G11C 13/042 ・・{using information stored in the form of an interference pattern (hologram, lippman; holography G03H, G02B 5/32)}

G11C 13/043 ・・・{using magnetic-optical storage elements}

G11C 13/044 ・・・{using electro-optical elements}

G11C 13/045 ・・・{using photochromic storage elements}

G11C 13/046 ・・・{using other storage elements storing information in the form of an interference pattern}

G11C 13/047 ・・{using electro-optical elements (G11C 13/042 takes precedence)}

G11C 13/048 ・・{using other optical storage elements}

G11C 13/06 ・・using magneto-optical elements (magneto-optics in general G02F){G11C 13/042 takes precedence}

G11C 14/00 Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down {bistable elements storing the actual state when the supply voltage fails H03K 3/02335, H03K 3/0375, H03K 3/2865, H03K 3/356008}

G11C 14/0009 ・{in which the volatile element is a DRAM cell}

G11C 14/0018 ・・{and the nonvolatile element is an EEPROM element, e.g. a floating gate or MNOS transistor}

G11C 14/0027 ・・{and the nonvolatile element is a ferroelectric element}

G11C 14/0036 ・・{and the nonvolatile element is a magnetic RAM [MRAM} element or ferromagnetic cell]

G11C 14/0045 ・・{and the nonvolatile element is a resistive RAM element, i.e. programmable resistors, e.g. formed of phase change or chalcogenide material.}

G11C 14/0054 ・{in which the volatile element is a SRAM cell}

G11C 14/0063 ・・{and the nonvolatile element is an EEPROM element, e.g. a floating gate or MNOS transistor}

G11C 14/0072 ・・{and the nonvolatile element is a ferroelectric element}

G11C 14/0081 ・・{and the nonvolatile element is a magnetic RAM [MRAM} element or ferromagnetic cell]

G11C 14/009 ・・{and the nonvolatile element is a resistive RAM element, i.e. programmable resistors, e.g. formed of phase change or chalcogenide material.}

G11C 15/00 Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores (in which information is addressed to a specific location G11C 11/00; {selection information using addressing means, e.g. hashing, tree addressing, chaining G06F 11/22; information retrieval systems using a computer G06F 17/30})

G11C 15/02 ・using magnetic elements

G11C 15/04 ・using semiconductor elements

G11C 15/043 ・・{using capacitive charge storage elements}

G11C 15/046 ・・{using non-volatile storage elements}

G11C 15/06 ・using cryogenic elements

G11C 16/00 Erasable programmable read-only memories (G11C 14/00 takes precedence)

G11C 16/02 ・electrically programmable {(programmable multibit digital storage elements G11C 11/5621)}

G11C 16/04 ・・using variable threshold transistors, e.g. FAMOS

G11C 16/0408 ・・・{comprising cells containing floating gate transistors (G11C 16/0483, G11C 16/0491 take precedence)}

G11C 16/0416 ・・・・{comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM}

G11C 16/0425 ・・・・[N. comprising cells containing a merged floating gate and select transistor]

G11C 16/0433 ・・・・{comprising cells containing a single floating gate transistor and one or more separate select transistors}

G11C 16/0441 ・・・・{comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates}

G11C 16/045 ・・・・・{Floating gate memory cells with both P and N channel memory transistors, usually sharing a common floating gate}

G11C 16/0458 ・・・・・{comprising plural independent floating gates which store independent data (for storage of more than two stable states at a single floating gate G11C 11/5621)}

G11C 16/0466 ・・・{comprising cells with charge storage in an insulating layer, e.g. MNOS, SNOS (G11C 16/0483, G11C 16/0491 take precedence)}

G11C 16/0475 ・・・・{comprising plural independent storage sites which store independent data (for storage of more than two stable states at a single storage site G11C 11/5621)}

G11C 16/0483 ・・・{comprising cells having several storage transistors connected in series}

G11C 16/0491 ・・・{Virtual ground arrays}

G11C 16/06 ・・Auxiliary circuits, e.g. for writing into memory (in general G11C 7/00)

G11C 16/08 ・・・Address circuits; Decoders; Word-line control circuits

G11C 16/10 ・・・Programming or data input circuits

G11C 16/102 ・・・・{External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators}

G11C 16/105 ・・・・・{Circuits or methods for updating contents of nonvolatile memory, especially with 'security' features to ensure reliable replacement, i.e. preventing that old data is lost before new data is reliably written}

G11C 16/107 ・・・・{Programming all cells in an array, sector or block to the same state prior to flash erasing}

G11C 16/12 ・・・・Programming voltage switching circuits

G11C 16/14 ・・・・Circuits for erasing electrically, e.g. erase voltage switching circuits

G11C 16/16 ・・・・・for erasing blocks, e.g. arrays, words, groups

G11C 16/18 ・・・・Circuits for erasing optically

G11C 16/20 ・・・・Initialising; Data preset; Chip identification

G11C 16/22 ・・・Safety or protection circuits preventing unauthorised or accidental access to memory cells

G11C 16/225 ・・・・{Preventing erasure, programming or reading when power supply voltages are outside the required ranges}

G11C 16/24 ・・・Bit-line control circuits

G11C 16/26 ・・・Sensing or reading circuits; Data output circuits

G11C 16/28 ・・・・using differential sensing or reference cells, e.g. dummy cells

G11C 16/30 ・・・Power supply circuits

G11C 16/32 ・・・Timing circuits

G11C 16/34 ・・・Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention

G11C 16/3404 ・・・・{Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells}

G11C 16/3409 ・・・・・{Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step}

G11C 16/3413 ・・・・・{Circuits or methods to recover overprogrammed nonvolatile memory cells detected during program verification, usually by means of a "soft" erasing step}

G11C 16/3418 ・・・・{Disturbance prevention or evaluation; Refreshing of disturbed memory data}

G11C 16/3422 ・・・・・{Circuits or methods to evaluate read or write disturbance in nonvolatile memory, without steps to mitigate the problem}

G11C 16/3427 ・・・・・{Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written}

G11C 16/3431 ・・・・・{Circuits or methods to detect disturbed nonvolatile memory cells, e.g. which still read as programmed but with threshold less than the program verify threshold or read as erased but with threshold greater than the erase verify threshold, and to reverse the disturbance via a refreshing programming or erasing step}

G11C 16/3436 ・・・・{Arrangements for verifying correct programming or erasure}

G11C 16/344 ・・・・・{Arrangements for verifying correct erasure or for detecting overerased cells}

G11C 16/3445 ・・・・・・{Circuits or methods to verify correct erasure of nonvolatile memory cells}

G11C 16/345 ・・・・・・{Circuits or methods to detect overerased nonvolatile memory cells, usually during erasure verification}

G11C 16/3454 ・・・・・{Arrangements for verifying correct programming or for detecting overprogrammed cells}

G11C 16/3459 ・・・・・・{Circuits or methods to verify correct programming of nonvolatile memory cells}

G11C 16/3463 ・・・・・・{Circuits or methods to detect overprogrammed nonvolatile memory cells, usually during program verification}

G11C 16/3468 ・・・・・{Prevention of overerasure or overprogramming, e.g. by verifying whilst erasing or writing}

G11C 16/3472 ・・・・・・{Circuits or methods to verify correct erasure of nonvolatile memory cells whilst erasing is in progress, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate erasure}

G11C 16/3477 ・・・・・・{Circuits or methods to prevent overerasing of nonvolatile memory cells, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate erasing}

G11C 16/3481 ・・・・・・{Circuits or methods to verify correct programming of nonvolatile memory cells whilst programming is in progress, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate programming}

G11C 16/3486 ・・・・・・{Circuits or methods to prevent overprogramming of nonvolatile memory cells, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate programming}

G11C 16/349 ・・・・{Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles}

G11C 16/3495 ・・・・・{Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically}

G11C 17/00 Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards ({multibit read-only memories G11C 11/5692;} erasable programmable read-only memories G11C 16/00; coding, decoding or code conversion, in general H03M; {combination of ROM and RAM G11C 11/005, G11C 14/00; for electrical control of combustion engines F02D 41/2406})

G11C 17/005 ・{with a storage element common to a large number of data, e.g. perforated card (G11C 17/02, G11C 17/04 take precedence)}

G11C 17/02 ・using magnetic or induction elements (G11C 17/14 takes precedence)

G11C 17/04 ・using capacitive elements (G11C 17/06, G11C 17/14 take precedence)

G11C 17/06 ・using diode elements (G11C 17/14 takes precedence)

G11C 17/08 ・using semiconductor devices, e.g. bipolar elements (G11C 17/06, G11C 17/14 take precedence)

G11C 17/10 ・・in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM

G11C 17/12 ・・・using field-effect devices

G11C 17/123 ・・・・{comprising cells having several storage transistors connected in series}

G11C 17/126 ・・・・{Virtual ground arrays}

G11C 17/14 ・in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM

G11C 17/143 ・・{using laser-fusible links}

G11C 17/146 ・・{Write once memory, i.e. allowing changing of memory content by writing additional bits}

G11C 17/16 ・・using electrically-fusible links

G11C 17/165 ・・・{Memory cells which are electrically programmed to cause a change in resistance, e.g. to permit multiple resistance steps to be programmed rather than conduct to or from non-conduct change of fuses and antifuses (digital stores using resistance random access memory elements G11C 13/0002)}

G11C 17/18 ・・Auxiliary circuits, e.g. for writing into memory (in general G11C 7/00)

G11C 19/00 Digital stores in which the information is moved stepwise, e.g. shift register (counting chains H03K 23/00){stack stores, push-down stores (linear pulse counters H03K 23/02, pulse distributors H03K 5/15, methods and arrangements for shifting data G06F 5/01)}

G11C 19/005 ・{with ferro-electric elements (condensers)}

G11C 19/02 ・using magnetic elements (G11C 19/14 takes precedence)

G11C 19/04 ・・using cores with one aperture or magnetic loop

G11C 19/06 ・・using structures with a number of apertures or magnetic loops, e.g. transfluxors {laddic}

G11C 19/08 ・・using thin films in plane structure {thin magnetic films and apparatus or processes specially adapted for manufacturing or assembling the same H01F 10/00, H01F 41/14}

G11C 19/0808 ・・・{using magnetic domain propagation}

G11C 19/0816 ・・・・{using a rotating or alternating coplanar magnetic field}

G11C 19/0825 ・・・・{using a variable perpendicular magnetic field}

G11C 19/0833 ・・・・{using magnetic domain interaction}

G11C 19/0841 ・・・・{using electric current}

G11C 19/085 ・・・{Generating magnetic fields therefor, e.g. uniform magnetic field for magnetic domain stabilisation (coil construction H01F 5/00; electromagnets H01F 7/06)}

G11C 19/0858 ・・・{Generating, replicating or annihilating magnetic domains (also comprising different types of magnetic domains, e.g. "Hard Bubbles")(G11C 19/0866 takes precedence)}

G11C 19/0866 ・・・{Detecting magnetic domains (measuring or detecting magnetic fields in general G01R 33/02)}

G11C 19/0875 ・・・{Organisation of a plurality of magnetic shift registers (FIFO G06F 5/06; LIFO G06F 7/78)}

G11C 19/0883 ・・・・{Means for switching magnetic domains from one path into another path, i.e. transfer switches, swap gates, decoders logic circuits using magnetic domains H03K 19/168}

G11C 19/0891 ・・・・・{using hybrid structure, e.g. ion doped layers}

G11C 19/10 ・・using thin films on rods; with twistors

G11C 19/12 ・using non-linear reactive devices in resonant circuits, {e.g. parametrons; magnetic amplifiers with overcritical feedback}

G11C 19/14 ・using magnetic elements in combination with active elements, e.g. discharge tubes, semiconductor elements {contains no documents, see provisionally G11C 19/02 to G11C 19/10}

G11C 19/18 ・using capacitors as main elements of the stages {if capacitors are used as auxiliary stage in between main stages with other elements, the latter take precedence; G11C 19/005 takes precedence}

G11C 19/182 ・・{in combination with semiconductor elements, e.g. bipolar transistors, diodes}

G11C 19/184 ・・・{with field-effect transistors, e.g. MOS-FET}

G11C 19/186 ・・・・{using only one transistor per capacitor, e.g. bucket brigade shift register}

G11C 19/188 ・・・{Organisation of a multiplicity of shift registers, e.g. regeneration, timing, input-output circuits (FIFO G06F 5/06; LIFO G06F 7/78)}

G11C 19/20 ・using discharge tubes (G11C 19/14 takes precedence)

G11C 19/202 ・・{with vacuum tubes (G11C 19/207 takes precedence)}

G11C 19/205 ・・{with gas-filled tubes (G11C 19/207 takes precedence)}

G11C 19/207 ・・{with counting tubes}

G11C 19/28 ・using semiconductor elements (G11C 19/14 takes precedence)

G11C 19/282 ・・{with charge storage in a depletion layer, i.e. charge coupled devices (C.C.D)}

G11C 19/285 ・・・{Peripheral circuits, e.g. for writing into the first stage; for reading-out of the last stage}

G11C 19/287 ・・{Organisation of a multiplicity of shift registers (FIFO G06F 5/06; LIFO G06F 7/78)}

G11C 19/30 ・using opto-electronic devices, i.e. light emitting and photoelectric devices electrically or optically coupled

G11C 19/32 ・using super-conductive elements

G11C 19/34 ・using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency {(in RAM multistable cells G11C 11/56; in capacitive analog stores G11C 27/04)}

G11C 19/36 ・・using {multistable} semiconductor elements

G11C 19/38 ・two-dimensional, e.g. horizontal and vertical shift registers

G11C 21/00 Digital stores in which the information circulates {continuously}(stepwise G11C 19/00)

G11C 21/005 ・{using electrical delay line (construction of such lines H03H 7/30, H03H 11/26)}

G11C 21/02 ・using electromechanical delay lines, e.g. using a mercury tank {construction of such lines H03H 9/00}

G11C 21/023 ・・{using piezo-electric transducers, e.g. mercury tank}

G11C 21/026 ・・{using magnetostriction transducers, e.g. nickel delay line}

G11C 23/00 Digital stores characterised by movement of mechanical parts to effect storage, e.g. using balls; Storage elements therefor (storing by actuating contacts G11C 11/50)

G11C 25/00 Digital stores characterised by the use of flowing media; Storage elements therefor {(multiple fluid-circuit element arrangements for performing digital operations F15C 1/12)}

G11C 27/00 Electric analogue stores, e.g. for storing instantaneous values {(integrating circuits acting as stores G06G 7/18; pulse counters with step by step integration and static storage H03K 25/00)}

G11C 27/005 ・{with non-volatile charge storage, e.g. on floating gate or MNOS}

G11C 27/02 ・Sample-and-hold arrangements (G11C 27/04 takes precedence; sampling electrical signals, in general H03K)

G11C 27/022 ・・{using a magnetic memory element}

G11C 27/024 ・・{using a capacitive memory element (G11C 27/04 takes precedence)}

G11C 27/026 ・・・{associated with an amplifier (G11C 27/028 takes precedence)}

G11C 27/028 ・・・{Current mode circuits, e.g. switched current memories}

G11C 27/04 ・Shift registers (charge coupled devices per se H01L 29/76)

G11C 29/00 Checking stores for correct operation; {Subsequent repair}; Testing stores during standby or offline operation {(testing of electronic circuits in general G01R 31/28; error detection or error correction in computer memories during normal operation G06F 11/1008, G06F 11/1666; testing of computers during standby G06F 11/22)}

G11C 29/003 ・{in serial memories}

G11C 29/006 ・{at wafer scale level, i.e. WSI (for test and configuration during manufacture H01L 22/00)}

G11C 29/02 ・Detection or location of defective auxiliary circuits, e.g. defective refresh counters

G11C 29/021 ・・{in voltage or current generators}

G11C 29/022 ・・{in I/O circuitry}

G11C 29/023 ・・{in clock generator or timing circuitry}

G11C 29/024 ・・{in decoders}

G11C 29/025 ・・{in signal lines}

G11C 29/026 ・・{in sense amplifiers}

G11C 29/027 ・・{in fuses}

G11C 29/028 ・・{with adaption or trimming of parameters}

G11C 29/04 ・Detection or location of defective memory elements, {e.g. cell constructio details, timing of test signals}

G11C 29/06 ・・Acceleration testing

G11C 29/08 ・・Functional testing, e.g. testing during refresh, power-on self testing (POST) or distributed testing

G11C 29/10 ・・・Test algorithms, e.g. memory scan (MScan) algorithms; Test patterns, e.g. checkerboard patterns

G11C 29/12 ・・・Built-in arrangements for testing, e.g. built-in self testing (BIST) {or interconnection details}

G11C 29/12005 ・・・・{comprising voltage or current generators}

G11C 29/1201 ・・・・{comprising I/O circuitry}

G11C 29/12015 ・・・・{comprising clock generation or timing circuitry}

G11C 29/14 ・・・・Implementation of control logic, e.g. test mode decoders

G11C 29/16 ・・・・・using microprogrammed units, e.g. state machines

G11C 29/18 ・・・・Address generation devices; Devices for accessing memories, e.g. details of addressing circuits

G11C 29/20 ・・・・・using counters or linear-feedback shift registers (LFSR)

G11C 29/22 ・・・・・Accessing serial memories

G11C 29/24 ・・・・・Accessing extra cells, e.g. dummy cells or redundant cells

G11C 29/26 ・・・・・Accessing multiple arrays (G11C 29/24 takes precedence)

G11C 29/28 ・・・・・・Dependent multiple arrays, e.g. multi-bit arrays

G11C 29/30 ・・・・・Accessing single arrays

G11C 29/32 ・・・・・・Serial access; Scan testing

G11C 29/34 ・・・・・・Accessing multiple bits simultaneously

G11C 29/36 ・・・・Data generation devices, e.g. data inverters

G11C 29/38 ・・・・Response verification devices

G11C 29/40 ・・・・・using compression techniques

G11C 29/42 ・・・・・using error correcting codes (ECC) or parity check

G11C 29/44 ・・・・Indication or identification of errors, e.g. for repair

G11C 29/4401 ・・・・・{for self repair}

G11C 29/46 ・・・・Test trigger logic

G11C 29/48 ・・・Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access (DMA) or using auxiliary access paths (external testing equipment G11C 29/56)

G11C 29/50 ・・Marginal testing, e.g. race, voltage or current testing

G11C 29/50004 ・・・{of threshold voltage}

G11C 29/50008 ・・・{of impedance}

G11C 29/50012 ・・・{of timing}

G11C 29/50016 ・・・{of retention}

G11C 29/52 ・Protection of memory contents; Detection of errors in memory contents

G11C 29/54 ・Arrangements for designing test circuits, e.g. design for test (DFT) tools

G11C 29/56 ・External testing equipment for static stores, e.g. automatic test equipment (ATE); Interfaces therefor

G11C 29/56004 ・・{Pattern generation}

G11C 29/56008 ・・{Error analysis, representation of errors}

G11C 29/56012 ・・{Timing aspects, clock generation, synchronisation}

G11C 29/56016 ・・{Apparatus features}

G11C 29/70 ・{Masking faults in memories by using spares or by reconfiguring}

G11C 29/702 ・・{by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones}

G11C 29/72 ・・{with optimized replacement algorithms}

G11C 29/74 ・・{using duplex memories, i.e. using dual copies}

G11C 29/76 ・・{using address translation or modifications}

G11C 29/765 ・・・{in solid state disks}

G11C 29/78 ・・{using programmable devices}

G11C 29/781 ・・・{combined in a redundant decoder}

G11C 29/783 ・・・{with refresh of replacement cells, e.g. in DRAMs}

G11C 29/785 ・・・{with redundancy programming schemes}

G11C 29/787 ・・・・{using a fuse hierarchy (for memories using fuses in general G11C 17/16)}

G11C 29/789 ・・・・{using non-volatile cells or latches (erasable programmable memory cells in general G11C 16/00)}

G11C 29/80 ・・・{with improved layout}

G11C 29/802 ・・・・{by encoding redundancy signals}

G11C 29/804 ・・・・{to prevent clustered faults}

G11C 29/806 ・・・・{by reducing size of decoders}

G11C 29/808 ・・・・{using a flexible replacement scheme}

G11C 29/81 ・・・・{using a hierarchical redundancy scheme}

G11C 29/812 ・・・・{using a reduced amount of fuses}

G11C 29/814 ・・・・{for optimized yield}

G11C 29/816 ・・・・{for an application-specific layout}

G11C 29/818 ・・・・・{for dual-port memories}

G11C 29/82 ・・・・・{for EEPROMs}

G11C 29/822 ・・・・・{for read only memories}

G11C 29/824 ・・・・・{for synchronous memories}

G11C 29/83 ・・・{with reduced power consumption}

G11C 29/832 ・・・・{with disconnection of faulty elements}

G11C 29/835 ・・・{with roll call arrangements for redundant substitutions}

G11C 29/838 ・・・{with substitution of defective spares}

G11C 29/84 ・・・{with improved access time or stability}

G11C 29/842 ・・・・{by introducing a delay in a signal path}

G11C 29/844 ・・・・{by splitting the decoders in stages}

G11C 29/846 ・・・・{by choosing redundant lines at an output stage}

G11C 29/848 ・・・・{by adjacent switching}

G11C 29/86 ・・{in serial access memories, e.g. shift registers, CCDs, bubble memories}

G11C 29/88 ・・{with partially good memories}

G11C 29/883 ・・・{using a single defective memory device with reduced capacity e.g. half capacity}

G11C 29/886 ・・・{combining plural defective memory devices to provide a contiguous address range e.g. one device supplies working blocks to replace defective blocks in another device}

G11C 99/00 Subject matter not provided for in other groups of this subclass

G11C 2013/00 Digital stores characterised by the use of storage elements not covered by groups G11C 11/00, G11C 23/00 to G11C 25/00

G11C 2013/0002 ・{using resistance random access memory [RRAM} elements]

G11C 2013/0021 ・・{Auxiliary circuits}

G11C 2013/004 ・・・{Reading or sensing circuits or methods}

G11C 2013/0042 ・・・・Read using differential sensing, e.g. bit line (BL) and bit line bar (BLB)

G11C 2013/0045 ・・・・Read using current through the cell

G11C 2013/0047 ・・・・Read destroying or disturbing the data

G11C 2013/005 ・・・・Read using potential difference applied between cell electrodes

G11C 2013/0052 ・・・・Read process characterized by the shape, e.g. form, length, amplitude of the read pulse

G11C 2013/0054 ・・・・Read is performed on a reference element, e.g. cell, and the reference sensed value is used to compare the sensed value of the selected cell

G11C 2013/0057 ・・・・Read done in two steps, e.g. wherein the cell is read twice and one of the two read values serving as a reference value

G11C 2013/0064 ・・・{Verifying circuits or methods}

G11C 2013/0066 ・・・・Verify correct writing whilst writing is in progress, e.g. by detecting onset or cessation of current flow in cell and using the detector output to terminate writing

G11C 2013/0069 ・・・{Writing or programming circuits or methods}

G11C 2013/0071 ・・・・Write using write potential applied to access device gate

G11C 2013/0073 ・・・・Write using bi-directional cell biasing

G11C 2013/0076 ・・・・Write operation performed depending on read result

G11C 2013/0078 ・・・・Write using current through the cell

G11C 2013/008 ・・・・Write by generating heat in the surroundings of the memory material, e.g. thermowrite

G11C 2013/0083 ・・・・Write to perform initialising, forming process, electro forming or conditioning

G11C 2013/0085 ・・・・Write a page or sector of information simultaneously, e.g. a complete row or word line

G11C 2013/0088 ・・・・Write with the simultaneous writing of a plurality of cells

G11C 2013/009 ・・・・Write using potential difference applied between cell electrodes

G11C 2013/0092 ・・・・Write characterized by the shape, e.g. form, length, amplitude of the write pulse

G11C 2013/0095 ・・・・Write using strain induced by, e.g. piezoelectric, thermal effects

G11C 2029/00 Checking stores for correct operation; {Subsequent repair}; Testing stores during standby or offline operation {(testing of electronic circuits in general G01R 31/28; error detection or error correction in computer memories during normal operation G06F 11/1008, G06F 11/1666; testing of computers during standby G06F 11/22)}

G11C 2029/04 ・Detection or location of defective memory elements, {e.g. cell constructio details, timing of test signals}

G11C 2029/0401 ・・in embedded memories

G11C 2029/0403 ・・during or with feedback to manufacture

G11C 2029/0405 ・・comprising complete test loop

G11C 2029/0407 ・・on power on

G11C 2029/0409 ・・Online test

G11C 2029/0411 ・・Online error correction

G11C 2029/08 ・・Functional testing, e.g. testing during refresh, power-on self testing (POST) or distributed testing

G11C 2029/12 ・・・Built-in arrangements for testing, e.g. built-in self testing (BIST) {or interconnection details}

G11C 2029/1202 ・・・・Word line control

G11C 2029/1204 ・・・・Bit line control

G11C 2029/1206 ・・・・Location of test circuitry on chip or wafer

G11C 2029/1208 ・・・・Error catch memory

G11C 2029/18 ・・・・Address generation devices; Devices for accessing memories, e.g. details of addressing circuits

G11C 2029/1802 ・・・・・Address decoder

G11C 2029/1804 ・・・・・Manipulation of word size

G11C 2029/1806 ・・・・・Address conversion or mapping, i.e. logical to physical address

G11C 2029/26 ・・・・・Accessing multiple arrays (G11C 29/24 takes precedence)

G11C 2029/2602 ・・・・・・Concurrent test

G11C 2029/30 ・・・・・Accessing single arrays

G11C 2029/3202 ・・・・・・Scan chain

G11C 2029/36 ・・・・Data generation devices, e.g. data inverters

G11C 2029/3602 ・・・・・Pattern generator

G11C 2029/38 ・・・・Response verification devices

G11C 2029/40 ・・・・・using compression techniques

G11C 2029/4002 ・・・・・・Comparison of products, i.e. test results of chips or with golden chip

G11C 2029/4402 ・・・・Internal storage of test result, quality data, chip identification, repair information

G11C 2029/50 ・・Marginal testing, e.g. race, voltage or current testing

G11C 2029/5002 ・・・Characteristic

G11C 2029/5004 ・・・Voltage

G11C 2029/5006 ・・・Current

G11C 2029/56 ・External testing equipment for static stores, e.g. automatic test equipment (ATE); Interfaces therefor

G11C 2029/5602 ・・Interface to device under test

G11C 2029/5604 ・・Display of error information

G11C 2029/5606 ・・Error catch memory

G11C 2207/00 Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store

G11C 2207/002 ・Isolation gates, i.e. gates coupling bit lines to the sense amplifier

G11C 2207/005 ・Transfer gates, i.e. gates coupling the sense amplifier output to data lines, I/O lines or global bit lines.

G11C 2207/007 ・Register arrays

G11C 2207/06 ・Sense amplifier related aspects

G11C 2207/061 ・・Sense amplifier enabled by a address transition detection related control signal

G11C 2207/063 ・・Current sense amplifiers

G11C 2207/065 ・・Sense amplifier drivers

G11C 2207/066 ・・Frequency reading type sense amplifier

G11C 2207/068 ・・Integrator type sense amplifier

G11C 2207/10 ・Aspects relating to interfaces of memory device to external buses

G11C 2207/101 ・・Analog or multilevel bus

G11C 2207/102 ・・Compression or decompression of data before storage

G11C 2207/104 ・・Embedded memory devices, e.g. memories with a processing device on the same die or ASIC memory designs

G11C 2207/105 ・・Aspects related to pads, pins or terminals

G11C 2207/107 ・・Serial-parallel conversion of data or prefetch

G11C 2207/108 ・・Wide data ports

G11C 2207/12 ・Equalization of bit lines

G11C 2207/16 ・Solid state audio (deprecated, only for historical reasons, G06F 3/16, G11B)

G11C 2207/22 ・Control and timing of internal memory operations

G11C 2207/2209 ・・Concurrent read and write (for multi-port memory G11C 7/1075)

G11C 2207/2218 ・・Late write

G11C 2207/2227 ・・Standby or low power modes

G11C 2207/2236 ・・Copy

G11C 2207/2245 ・・Memory devices with an internal cache buffer

G11C 2207/2254 ・・Calibration

G11C 2207/2263 ・・Write conditionally, e.g. only if new data and old data differ

G11C 2207/2272 ・・Latency related aspects

G11C 2207/2281 ・・Timing of a read operation (sense amplifier timing G11C 7/06, G11C 7/08)

G11C 2207/229 ・・Timing of a write operation (sense amplifier timing G11C 7/06, G11C 7/08)

G11C 2211/00 Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor

G11C 2211/401 ・Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells

G11C 2211/4013 ・・Memory devices with multiple cells per bit, e.g. twin-cells

G11C 2211/4016 ・・Memory devices with silicon-on-insulator cells

G11C 2211/406 ・・Refreshing of dynamic cells

G11C 2211/4061 ・・・Calibration or ate or cycle tuning

G11C 2211/4062 ・・・Parity or ECC in refresh operations

G11C 2211/4063 ・・・Interleaved refresh operations

G11C 2211/4065 ・・・Low level details of refresh operations

G11C 2211/4066 ・・・Pseudo-SRAMs

G11C 2211/4067 ・・・Refresh in standby or low power modes.

G11C 2211/4068 ・・・Voltage or leakage in refresh operations

G11C 2211/56 ・Indexing scheme relating to G11C 11/56 and sub-groups for features not covered by these groups

G11C 2211/561 ・・Multilevel memory cell aspects

G11C 2211/5611 ・・・Multilevel memory cell with more than one control gate

G11C 2211/5612 ・・・Multilevel memory cell with more than one floating gate

G11C 2211/5613 ・・・Multilevel memory cell with additional gates, not being floating or control gates

G11C 2211/5614 ・・・Multilevel memory cell comprising negative resistance, quantum tunneling or resonance tunneling elements

G11C 2211/5615 ・・・Multilevel magnetic memory cell using non-magnetic non-conducting interlayer, e.g. MTJ

G11C 2211/5616 ・・・Multilevel magnetic memory cell using non-magnetic conducting interlayer, e.g. GMR, SV, PSV

G11C 2211/5617 ・・・Multilevel ROM cell programmed by source, drain or gate contacting

G11C 2211/562 ・・Multilevel memory programming aspects

G11C 2211/5621 ・・・Multilevel programming verification

G11C 2211/5622 ・・・Concurrent multilevel programming of more than one cell

G11C 2211/5623 ・・・Concurrent multilevel programming and reading

G11C 2211/5624 ・・・Concurrent multilevel programming and programming verification

G11C 2211/5625 ・・・Self-converging multilevel programming

G11C 2211/563 ・・Multilevel memory reading aspects

G11C 2211/5631 ・・・Concurrent multilevel reading of more than one cell

G11C 2211/5632 ・・・Multilevel reading using successive approximation

G11C 2211/5633 ・・・Mixed concurrent serial multilevel reading

G11C 2211/5634 ・・・Reference cells

G11C 2211/564 ・・Miscellaneous aspects

G11C 2211/5641 ・・・Multilevel memory having cells with different number of storage levels

G11C 2211/5642 ・・・Multilevel memory with buffers, latches, registers at input or output

G11C 2211/5643 ・・・Multilevel memory comprising cache storage devices

G11C 2211/5644 ・・・Multilevel memory comprising counting devices

G11C 2211/5645 ・・・Multilevel memory with current-mirror arrangements

G11C 2211/5646 ・・・Multilevel memory with flag bits, e.g. for showing that a "first page" of a word line is programmed but not a "second page"

G11C 2211/5647 ・・・Multilevel memory with bit inversion arrangement

G11C 2211/5648 ・・・Multilevel memory programming, reading or erasing operations wherein the order or sequence of the operations is relevant

G11C 2211/5649 ・・・Multilevel memory with plate line or layer, e.g. in order to lower programming voltages

G11C 2211/565 ・・・Multilevel memory comprising elements in triple well structure

G11C 2213/00 Indexing scheme relating to G11C 13/00 for features not covered by this group

G11C 2213/10 ・Resistive cells; Technology aspects

G11C 2213/11 ・・Metal ion trapping, i.e. using memory material including cavities, pores or spaces in form of tunnels or channels wherein metal ions can be trapped but do not react and form an electro-deposit creating filaments or dendrites

G11C 2213/12 ・・Non-metal ion trapping, i.e. using memory material trapping non-metal ions given by the electrode or another layer during a write operation, e.g. trapping, doping

G11C 2213/13 ・・Dissociation, i.e. using memory material including molecules which, during a write operation, are dissociated in ions which migrate further in the memory material

G11C 2213/14 ・・Use of different molecule structures as storage states, e.g. part of molecule being rotated

G11C 2213/15 ・・Current-voltage curve

G11C 2213/16 ・・Memory cell being a nanotube, e.g. suspended nanotube

G11C 2213/17 ・・Memory cell being a nanowire transistor

G11C 2213/18 ・・Memory cell being a nanowire having RADIAL composition

G11C 2213/19 ・・Memory cell comprising at least a nanowire and only two terminals

G11C 2213/30 ・Resistive cell, memory material aspects

G11C 2213/31 ・・Material having complex metal oxide, e.g. perovskite structure

G11C 2213/32 ・・Material having simple binary metal oxide structure

G11C 2213/33 ・・Material including silicon

G11C 2213/34 ・・Material includes an oxide or a nitride

G11C 2213/35 ・・Material including carbon e.g. graphite, grapheme

G11C 2213/50 ・Resistive cell structure aspects

G11C 2213/51 ・・Structure including a barrier layer preventing or limiting migration, diffusion of ions or charges or formation of electrolytes near an electrode

G11C 2213/52 ・・Structure characterized by the electrode material, shape, etc.

G11C 2213/53 ・・Structure wherein the resistive material being in a transistor, e.g. gate

G11C 2213/54 ・・Structure including a tunneling barrier layer, the memory effect implying the modification of tunnel barrier conductivity

G11C 2213/55 ・・Structure including two electrodes, a memory active layer and at least two other layers which can be a passive or source or reservoir layer or a less doped memory active layer

G11C 2213/56 ・・Structure including two electrodes, a memory active layer and a so called passive or source or reservoir layer which is NOT an electrode, wherein the passive or source or reservoir layer is a source of ions which migrate afterwards in the memory active layer to be only trapped there, to form conductive filaments there or to react with the material of the memory active layer in redox way

G11C 2213/70 ・Resistive array aspects

G11C 2213/71 ・・Three dimensional array

G11C 2213/72 ・・Array wherein the access device being a diode

G11C 2213/73 ・・Array where access device function, e.g. diode function, being merged with memorizing function of memory element

G11C 2213/74 ・・Array wherein each memory cell has more than one access device

G11C 2213/75 ・・Array having a NAND structure comprising, for example, memory cells in series or memory elements in series, a memory element being a memory cell in parallel with an access transistor

G11C 2213/76 ・・Array using an access device for each cell which being not a transistor and not a diode

G11C 2213/77 ・・Array wherein the memory element being directly connected to the bit lines and word lines without any access device being used

G11C 2213/78 ・・Array wherein the memory cells of a group share an access device, all the memory cells of the group having a common electrode and the access device being not part of a word line or a bit line driver

G11C 2213/79 ・・Array wherein the access device being a transistor

G11C 2213/80 ・・Array wherein the substrate, the cell, the conductors and the access device are all made up of organic materials

G11C 2213/81 ・・Array wherein the array conductors ,e.g. word lines, bit lines, are made of nanowires

G11C 2213/82 ・・Array having, for accessing a cell, a word line, a bit line and a plate or source line receiving different potentials

G11C 2216/00 Indexing scheme relating to G11C 16/00 and subgroups, for features not directly covered by these groups

G11C 2216/02 ・Structural aspects of erasable programmable read-only memories

G11C 2216/04 ・・Nonvolatile memory cell provided with a separate control gate for erasing the cells, i.e. erase gate, independent of the normal read control gate

G11C 2216/06 ・・Floating gate cells in which the floating gate consists of multiple isolated silicon islands, e.g. nanocrystals

G11C 2216/08 ・・Nonvolatile memory wherein data storage is accomplished by storing relatively few electrons in the storage layer, i.e. single electron memory

G11C 2216/10 ・・Floating gate memory cells with a single polysilicon layer

G11C 2216/12 ・Reading and writing aspects of erasable programmable read-only memories

G11C 2216/14 ・・Circuits or methods to write a page or sector of information simultaneously into a nonvolatile memory, typically a complete row or word line in flash memory

G11C 2216/16 ・・Flash programming of all the cells in an array, sector or block simultaneously

G11C 2216/18 ・・Flash erasure of all the cells in an array, sector or block simultaneously

G11C 2216/20 ・・Suspension of programming or erasing cells in an array in order to read other cells in it

G11C 2216/22 ・・Nonvolatile memory in which reading can be carried out from one memory bank or array whilst a word or sector in another bank or array is being erased or programmed simultaneously

G11C 2216/24 ・・Nonvolatile memory in which programming can be carried out in one memory bank or array whilst a word or sector in another bank or array is being erased simultaneously

G11C 2216/26 ・・Floating gate memory which is adapted to be one-time programmable [OTP], e.g. containing multiple OTP blocks permitting limited update ability

G11C 2216/28 ・・Floating gate memory programmed by reverse programming, e.g. programmed with negative gate voltage and erased with positive gate voltage or programmed with high source or drain voltage and erased with high gate voltage

G11C 2216/30 ・・Reduction of number of input/output pins by using a serial interface to transmit or receive addresses or data, i.e. serial access memory

G11C 2229/00 Indexing scheme relating to checking stores for correct operation, subsequent repair or testing stores during standby or offline operation

G11C 2229/70 ・Indexing scheme relating to G11C 29/70, for implementation aspects of redundancy repair

G11C 2229/72 ・・Location of redundancy information

G11C 2229/723 ・・・Redundancy information stored in a part of the memory core to be repaired.

G11C 2229/726 ・・・Redundancy information loaded from the outside into the memory

G11C 2229/74 ・・Time at which the repair is done

G11C 2229/743 ・・・After packaging

G11C 2229/746 ・・・Before packaging

G11C 2229/76 ・・Storage technology used for the repair

G11C 2229/763 ・・・E-fuses, e.g. electric fuses or antifuses, floating gate transistors

G11C 2229/766 ・・・Laser fuses